Modeling of Ion Sensitive Field Effect Transistor for Sensing Application using TCAD
Abstract
Hydrogen ion concentration (pH) of a solution can be measured using FET type sensor called Ion sensitive field effect transistor, ISFET. Chemical reactions occur at the electrolyte – insulator interface making the FET sensitive to pH. The objective of this work is to model the electrolyte-insulator structure of a transistor using Silvaco TCAD tool. Sensitivity is measured based on the shift in the threshold voltage which is caused by the effect of pH on the charge and the potential distributions in the gate insulator. Based on the analytical calculation of parameters of the electrolyte region, semiconductor materials are used to model the reference electrode and electrolyte. In this study, Silicon Nitride and Aluminum Oxide are used as gate insulators for ISFET and their performance comparison is made for sensing applications. The transfer and output characteristics of the transistor are obtained by simulation for both the films for various thicknesses. A comparison of the effect of thickness of films on device performance is analyzed since the dielectric constant of Aluminum oxide is higher than Silicon nitride.
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References
S. Sinha, T. Pal. A comprehensive review of FET-based pH sensors: materials, fabrication technologies, and modeling. Electrochemical Science Advances Electrochemical Science Advances, 2(5), (2022) e2100147. https://doi.org/10.1002/elsa.202100147
P. Bergveld, (1972) Development, Operation, and Application of the Ion-Sensitive Field-Effect Transistor as a tool for electrophysiology, IEEE Trans. Biomedical Engineering, MBE-19, 342- 351.
M. W. Shinwari, M. Jamal Deen, D. Landh, Study of the electrolyte-insulator-semiconductor field effect, Microelectronics Reliability, 47(12), (2007) 2025-2057. https://doi.org/10.1016/j.microrel.2006.10.003
F. Pittino, P. Palestri, P. Scarbolo, D. Esseni, L. Selmi, Models for the use of commercial TCAD in the analysis of silicon-based integrated biosensors, Solid-State Electron., 98, (2014) 63-69. https://doi.org/10.1016/j.sse.2014.04.011
Silvaco International, (2005) Athena and Atlas User's Manual Process Simulation Software, USA, Silvaco International.
A. Bandiziol, P. Palestri, F. Pittino, D. Esseni and L.Selmi, A TCAD-Based Methodology to Model the Site-Binding Charge at ISFET/Electrolyte Interfaces, IEEE Transactions On Electron Devices, 62(10) (2015). https://doi.org/10.1109/TED.2015.2464251
D. Welch, S. Shah, S. Ozev, J. Blain Christem, Experimental and Simulated Cycling of ISFET Electric Fields for Drift Reset, IEEE Electron Device Letters, 34(3), (2013). https://doi.org/10.1109/LED.2013.2240648
N. Choksi, D. Sewake, S. Sinha, R. Mukhiya and R. Sharma, Modeling and simulation of ion-sensitive field-effect transistor using TCAD methodology, 1st International Conference on Electronics, Materials Engineering and Nano-Technology (IEMENTech), Kolkata, India, (2017), 1-4.
S. Sharma, N. Tiwari, P. Kumar Pandiya, M. Manohar Agrawal, D. Shrivastava, Design and Simulation of ISFET Using Si3N4 as the Sensing Layer for Biomedical Applications, International Journal of Engineering and Technical Research, 2, (2014) 232-234.
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